- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02002 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
Patent holdings for IPC class G01B 9/02002
Total number of patents in this class: 33
10-year publication summary
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0
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1
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1
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0
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1
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0
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7
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11
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9
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2
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| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 6816 |
5 |
| Seiko Epson Corporation | 18724 |
4 |
| The General Hospital Corporation | 4517 |
2 |
| Beijing U-precision Tech Co., Ltd. | 58 |
2 |
| Applied Materials, Inc. | 16587 |
1 |
| Mitsubishi Electric Corporation | 43934 |
1 |
| Raytheon Company | 8535 |
1 |
| Tsinghua University | 5426 |
1 |
| Nokia Technologies Oy | 15057 |
1 |
| ams International AG | 399 |
1 |
| ADIGE S.p.A. | 48 |
1 |
| Birmingham, The University of | 1 |
1 |
| Carl Zeiss Industrielle Messtechnik GmbH | 433 |
1 |
| Hifi Engineering Inc. | 125 |
1 |
| HRL Laboratories, LLC | 1588 |
1 |
| Medlumics S.L. | 75 |
1 |
| Mitsubishi Electric Research Laboratories, Inc. | 1010 |
1 |
| Mitutoyo Corporation | 1218 |
1 |
| Screen Holdings Co., Ltd. | 2431 |
1 |
| The University of Chicago | 1282 |
1 |
| Other owners | 4 |